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Section 1: Basic Information

Ready Solution

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Section 2: Stat Information

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Issues
Possible of Yield Loss Per Annum*: 
$0
*Reference number come from pcs of scratched off wafer x occurence x average price per wafer
Score Tiers
Catergory
Recommendation
9 to 15
High Risk
Consider adopting Sigenic Solution 
4 to 8
Medium Risk
May escalate to high risk if ignore
1 to 3
Low Risk
Tolerable loss, but great saving opportunity

Section 3: Other Relevant Information (Optional)

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